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This topic has appeared in the trending rankings 1 time(s) in the past year. While it does not trend frequently, its appearance suggests a renewed or concentrated surge of public interest.
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Ballistic_electron_emission_microscopy entered the ranking for the first time today at position #. This is its highest position ever recorded.
This topic has appeared in the English Wikipedia rankings 1 time. It first appeared on 2026-04-04 and was most recently seen on 2026-04-04.
Ballistic electron emission microscopy or BEEM is a technique for studying ballistic electron transport through a variety of materials and material interfaces. BEEM is a three terminal scanning tunneling microscopy (STM) technique that was invented in 1988 at the Jet Propulsion Laboratory in Pasadena, California by L. Douglas Bell, Michael H. Hecht, and William J. Kaiser. The most popular interfaces to study are metal–semiconductor Schottky diodes, but metal–insulator–semiconductor systems can be studied as well.
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